Dr. Kelvin Xie’s research focuses on understanding and designing materials at nano- and atomic-scales using advanced microstructural characterizations (e.g. TEM and atom probe tomography). Kelvin is currently an Assistant Professor at Department of Materials Science and Engineering at Texas A&M University. Before this appointment, he was working as a Postdoctoral Research Fellow and then as an Assistant Research Scientist with Prof. Kevin Hemker at Johns Hopkins University. He obtained his Ph.D. at the Department of Mechanical Engineering and Australian Centre for Microscopy and Microanalysis under the supervision of Profs. Julie Cairney and Simon Ringer.